SPM-Nanoa

Scanning Probe Microscope/Atomic Force Microscope

Características

Automatic Observation

Adjusts Laser Beam, Adjusts Parameter Settings During Observation, and Performs Image Processing Automatically
Extensive Functionality

Capture Sharp Images with Optical Microscopy to SPM Microscopy Modes
Saves Time

Various Support Functionality Achieves Fast Observation

Aprender ms

Learn More

Descargue el folleto más reciente.

Instruments for Evaluating Electronic Devices [ PDF / 5.65MB ]

SPM-Nanoa - Scanning Probe Microscope/Atomic Force Microscope [ PDF / 9.69MB ]

Solutions for CASE and Weight Reduction Development of Automobiles [ PDF / 44.18MB ]

Documents	Fecha Fecha de creación
Application Software
Electrochemical activity evaluation and potential evaluation in positive electrode of All-Solid-State Lithium-Ion Battery [ PDF / 811.03KB ]	2024-06-04
Multifaceted Evaluation of Plastics: Differences due to PC/ABS Resin Compounding Ratio [ PDF / 1.02MB ]	2023-10-24
Surface Potential Measurement at the Electrode- Electrolyte Interface of a Charged All-Solid-State Lithium-Ion Battery [ PDF / 865.46KB ]	2023-04-12