SPM-Nanoa - Configuración

Scanning Probe Microscope/Atomic Force Microscope

Contacto

Wide Assortment of Expansion Functionality

Functionality and Expandability for Satisfying a Wide Variety of Requirements

■ Indicates standard specifications □ Indicates optional specifications
Other specifications are also available by special order. For more information, contact a Shimadzu representative.

■Contact Mode

■Dynamic Mode

■Phase Mode

■Lateral Force Mode (LFM)

■Force Modulation Mode

□Current / I-V Mode

□Surface Potential Mode (KPFM)

□Lateral Force Mode (MFM)

■Force Curve
□Nano 3D Mapping Fast

□Piezoelectric Force
Mode (PFM)

□STM

□Vector Scanning

□Observation in Liquid

Optional

■ Indicates standard specifications □ Indicates optional specifications
Other specifications are also available by special order. For more information, contact a Shimadzu representative.

■HT Scanner
(10 μm x 10 μm x 1 μm)

□Medium-Range Scanner
(30 μm x 30 μm x 5 μm)

□Large-Range Scanner
(125 μm x 125 μm x 7 μm)

□Deep-Type Scanner
(55 μm x 55 μm x 13 μm)

□Small-Range Scanner
(2.5μm x 2.5μm x 0.5μm)

□Fiber Light

Cross-Sectional View Sample Holder
□Cross-Sectional View
Sample Holder

□Particle Analysis Software

□Active Vibration Damper
□Active Vibration Damper with a Stand

Stand

□Cantilever Mounting Jig

□Static Eliminator

□Computer Table

Shape

Contact Mode

Surface shape is observed by scanning with the amount of cantilever bending kept constant.

Dynamic Mode

Surface shape is observed by scanning with the amplitude of cantilever oscillation kept constant.

Physical Properties

Phase Mode

This mode observes the surface viscoelasticity distribution by detecting the phase shift delay in cantilever oscillation.

Lateral Force Mode (LFM)

This mode observes the horizontal forces (friction forces) by detecting cantilever torsion.

Force Modulation Mode

This mode observes the distribution of viscosity and elasticity by separating the cantilever response into amplitude and phase components.

Nano 3D Mapping™ Fast　 Optional

This calculates the elastic modulus, adsorption forces, or other properties of sample surfaces based on force curve measurements and then observe the distribution of those values.