SPM-8100FM - Especificaciones
High-Resolution Scanning Probe Microscope
| Observation mode |
Contact, dynamic (AM method and FM method), lateral force (LFM) |
|---|---|
| Resolution |
Horizontal: 0.2 nm; Vertical: 0.01 nm |
| SPM head |
Displacement detection system: Light source, optical lever, detector Light source: Laser diode (ON/OFF) Irradiates a cantilever continuously even while replacing samples Detector: Photodetector |